Call for tenders' details

Title:
NL-Petten: Supply and Maintenance of a Dual Beam Plasma Focused Ion Beam — Field...
Contracting authority:
European Commission, Joint Research Centre - Petten (JRC-PTT)
TED publication date:
03/06/2019
Time limit for receipt of tenders:
18/07/2019
Status:
Closed
Information
JRC/PTT/2019/OP/1257
NL-Petten: Supply and Maintenance of a Dual Beam Plasma Focused Ion Beam — Field Emission Scanning Electron Microscope (pFIB — SEM)
In order to perform in-situ large area contamination-free sample preparation and high resolution imaging and analysis, the JRC Petten plans to purchase a Dual Beam microscope (pFIB-SEM) featuring an inductively coupled plasma as ion beam source (pFIB) and a field emission electron beam as source for electron imaging. The pFIB/SEM infrastructure will support scientific activities in nuclear safety and in medical applications of nuclear science. For that purpose, the system will include energy dispersive x-ray (EDX), Electron Backscatter Diffraction (EBSD) and Scanning-Transmission Electron Microscope (STEM) detectors and allow micro-machining of micro-mechanical specimens, TEM lamellae preparation of metals and biological materials, and 3D reconstructions of inorganic materials and cells.
Supplies
Open procedure
Closed
Checked
Best price-quality ratio
38510000
NL328
Additional CPV Supplementary CPV
38512100
Milestones
03/06/2019 00:00
N/A
N/A
18/07/2019 16:00
19/07/2019 15:00
Lots The call for tenders has no lots.
Notices
Reference Notice type Publication date
2019/S 114-278796 Corrigendum 17/06/2019 00:00
2019/S 109-264184 Corrigendum 07/06/2019 00:00
2019/S 105-254383 Contract notice 03/06/2019 00:00